Continuous observation of tensile deformation of polycrystalline pure titanium by scanning probe microscope
نویسندگان
چکیده
منابع مشابه
Studying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملstudying of various nanolithography methods by using scanning probe microscope
the scanning probe microscopes (spms) based lithographic techniques have been demonstrated as an extremely capable patterning tool. manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. in this paper, a qualified overview of diverse lithog...
متن کاملObservation of nanostructure by scanning near- field optical microscope with small sphere probe
Step and terrace structure has been observed in an area of 1 mm 1 mm on the cleaved surface of KCl–KBr solid-solution single crystal by scanning near-field optical microscope (SNOM) with a small sphere probe of 500 nm diameter. Lateral spatial resolution of the SNOM system was estimated to be 20 nm from the observation of step width and the scanning-step interval. Vertical spatial resolution wa...
متن کاملSwitchable Stiffness Scanning Microscope Probe
Atomic Force Microscopy (AFM) has rapidly gained widespread utilization as an imaging device and micro/nano-manipulator during recent years. This thesis investigates the new concept of a dual stiffness scanning probe with respect to biological applications and determines the resulting requirements for the scanning of soft bio samples, such as lowpressure contact. On this basis, an in-plane AFM ...
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ژورنال
عنوان ژورنال: Journal of Japan Institute of Light Metals
سال: 2003
ISSN: 0451-5994,1880-8018
DOI: 10.2464/jilm.53.295